二手 PARK SYSTEMS NX-WAFER 设备

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PARK SYSTEMS

NX-WAFER

类别

AFM

概述

Automated AFM metrology system for semiconductor and related fabrications. Provides wafer fab inspection and analysis, automatic defect review for bare wafers and substrates, and CMP profile measurements. Capable of scanning 300 mm wafers

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NX-WAFER

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概述

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