概述

The Park Systems' XE-PTR is a sophisticated, fully automatic industrial Atomic Force Microscope (AFM) designed primarily for metrology in the manufacture of Read/Write heads. It excels in automatic Pole Tip Recession measurements at various production stages, including Rowbar-level, individual Slider-level, and HGA-level sliders. Offering sub-nano scale accuracy and repeatability, combined with high throughput, the XE-PTR stands out as a preferred metrology tool for Slider manufacturers aiming to enhance their production yield.