Teradyne Inc., a maker of electronic test equipment based in North Reading, reports it has completed the acquisition of San Jose-based Nextest Systems Corp. 
Nextest is a low-cost leader in the design and manufacture of ATE for non-volatile memory, microcontrollers, ASIC and SOC semiconductors.

TERADYNE / NEXTEST

MAGNUM 2X SSV VP LC

MAGNUM V SSV WS

MAGNUM PV SCM

MAGNUM 2X GV WS

MAGNUM 2 SSV

MAGNUM 2X PV-SCM

MAGNUM 2 SSV FT

MAGNUM 1 GV FT

MAGNUM EPIC SSV

MAGNUM 2x SV FT

MAGNUM 2X GV FT

Maverick VT is a 256-pin solution that requires only 5 square feet of floor space

MAVERICK VT

MAGNUM VU EV

MAGNUM 2 SSV WS

MAGNUM VUx

MAGNUM VU SSV

MAGNUM 1 GV WS

MAGNUM VU GV

Magnum 1 SSV WS

MAGNUM EPIC

MAGNUM 2X PV

MAGNUM 2X

MAGNUM 2X SV

MAGNUM 1 GV

MAGNUM 2X SSV WS

MAGNUM PV HD

MAGNUM V GV VP

MAGNUM 2 GV FT

MAGNUM V SSV (FT)

MAGNUM V GV FT

MAGNUM 2X SSV LC FT

Maverick, our first product, was introduced in 1998. We have sold over 1,000 Maverick test systems to date. Maverick provides test frequencies of up to 66 MHz, and is directed at applications requiring the lowest cost. These systems test a wide range of devices, including flash and other types of memory, logic devices, microcontrollers, smart cards and other SOCs. The Maverick is used throughout the IC design and manufacturing process, including R&D, manufacturing and quality assurance. It is available in four packages—PT, ST, SST and GT—which range in size from 16 to 512 pins.

MAVERICK I GT

Maverick.    Maverick, our first product, was introduced in 1998. We have sold over 1,000 Maverick test systems to date. Maverick provides test frequencies of up to 66 MHz, and is directed at applications requiring the lowest cost. These systems test a wide range of devices, including flash and other types of memory, logic devices, microcontrollers, smart cards and other SOCs. The Maverick is used throughout the IC design and manufacturing process, including R&D, manufacturing and quality assurance. It is available in four packages—PT, ST, SST and GT—which range in size from 16 to 512 pins.

MAVERICK I SST

MAGNUM 2 EV

Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.

MAGNUM 2

Maverick II.    Since its introduction in 2001, we have sold over 300 Maverick II test systems. Maverick II doubled Maverick’s test frequency to 133 MHz and provides enhanced performance and accuracy, while retaining all of the advantages of the Maverick architecture. Its expanded performance and feature set make Maverick II a compelling choice for more demanding R&D and manufacturing applications. Maverick II tests a wide range of devices, including flash and other types of memory, logic devices, microcontrollers, smart cards and other SOCs. It is available in four packages—PT, ST, SST and GT—which range in size from 16 to 512 pins.

MAVERICK II PT

MAGNUM V EV

MAGNUM II ICP 1280

MAGNUM 1 EV

MAGNUM 1

MAGNUM 1 PV

The Magnum 2 PV is a versatile and powerful device that can be used for complex memory and logic applications. It has a five-slot chassis that can support up to 640 digital I/O pins in 128 pin increments. The device can be configured with multiple DPS, VRC, or MPAC option boards matched with the appropriate number of digital I/O channels to meet the requirements of the application. This makes it a great choice for those who need a flexible and customizable solution for their needs.

MAGNUM 2 PV

MAGNUM SSV-VP

The Magnum 2 SV is a high-mix production solution that can support up to 1,024 digital pins for parallel test. It is designed for both final test and wafer sort production. The Magnum 2 SV is compatible with industry standard handlers and wafer probers, including hinge and column manipulators. This makes it a versatile and reliable choice for high-volume production environments.

MAGNUM 2 SV

MAGNUM 1 SSV

MAGNUM 2X SSV

MAGNUM V

MAGNUM ICP 1280

Magnum SV is a high-mix production solution for memory testing, offering up to 1280 digital pins for parallel testing. It is part of Teradyne’s Magnum test system, which delivers high throughput and high parallel test efficiency for non-volatile memories, static RAM memories, and logic devices. Magnum SV is designed for final test and wafer sort production and is compatible with industry-standard handlers and wafer probers, including hinge and column manipulators. With its low cost and high efficiency, Magnum SV is an excellent choice for memory testing.

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MAGNUM 2X SSV VP LC

MAGNUM V SSV WS

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MAGNUM 2X GV WS

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MAGNUM V SSV WS

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MAGNUM 2X GV WS

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