OLYMPUS

STB1	

STM7

The Vanox was the flagship in the Olympus America microscope lineup during most of the 1970s.

VANOX

CK40

MX51F	

KIF-202

AL3320

SZX7	

BH2-MJL-73D

FR3200

CX31

BX41TF

BH3-MJL-A6

Brightfield / Darkfield Reflected Light Metallurgical Microscope

BX60M

WLS 8000

BX51TRF

AL120 +MX61

AL3130F

BH3-MJL-A5

The Olympus AL120 is a semiconductor wafer handler with a microscope. It is designed to accommodate different wafer sizes, making it a key tool for expanding wafer fabrication facilities. The AL120 series consists of three models based on wafer diameter: the 200mm model, the 150mm and 200mm convertible model, and the 150mm model for wafer sizes of 150mm or less. Each system is designed for wafer transfer and microscope inspection, with topside and backside macro inspections available for all wafer sizes. The 360-degree self-rotating function provides a complete macro inspection of the wafer’s top and back surface, enabling easy identification of defects and particles

AL120

IX50

BH3-MJLA4-383D

AL110-LMB12

BX60

MX80 AF F

BX51RF

AL3120F-DUV-EL

SZH-ILLC-2

AL-1MBL-6

100N-LM8

AL100-MB8	

PME 3

The CKX41 is an inverted microscope suitable for regular cell observation including GFP and other fluorescence applications. The high-angle tilting head is ideal for simple visual checks, while advanced Universal Infinity System 2 (UIS2) optics produce outstanding images. Olympus relief contrast increases visibility with non-glass cell culture vessels and improves productivity with its pre-centered slider. Post-acquisition analysis, documentation, and archiving can be achieved with digital cameras and software.

CKX41

GX53

OLS5100

MX63L

STM7-MF

AL3120

AL 3110F

The UC50 is a 5 megapixel digital color camera ideal for high resolution imaging providing 14-bit a wide dynamic range and high sensitivity along with a variety of frame rates using pixel binning and partial readout modes.

CCD chip
The 2,576 x 1,932-pixel CCD chip used in the UC50 offers 14 bits per color channel and can be used for variable exposure times between 100 μs and 160 s. These features, along with the high sensitivity, color fidelity, and superior contrast make the UC50 a great universal high-resolution color camera.

UC50

SZX16

AL3120F-DUV

MX50T-F

AL3120F

Innov-X DP 6000

AL110-LMB8

IX73

The LEXT OLS4100 3D measuring laser microscope uses laser scanning to perform non-contact 3D measurement of complex surface features on electronic devices and other samples. As with current Olympus models, the LEXT OLS4100 guarantees both repeatability*1 and accuracy*2, while also being capable of high-resolution observation and highly accurate measurement over a wider area. It also features easier operation, including a function for acquiring 3D images automatically with a single click, and an image acquisition speed that is approximately twice as fast as the existing Olympus models.

LEXT OLS4100

MX61L-F

AL-1BL-6

AL110-MB86

SZ6045

AL100+

AL100-LM86

BX50

SZ1145TR

PMG3

SZ60TR-60 

AL3100

AL3300

KL 1500 LCD

USPM-RU III 

5900PR

MX50L-RF

STM6-F21-3

STM6-F10-3	

The FV1000 confocal laser scanning biological microscope was released in 2004.
This model featured the world's first twin scan system. This system enabled time-resolved spectroscopy of living intercellular contents and also made it possible to analyze objects down to a 2 nm wavelength resolution. Image size was increased to 4096 x 4096-pixels.

FV1000

BX41RF-LED

BX60MF5	

FV3000

AL120-LMB12

MX40F

AL2100

AL120-L6-150

IX70-S8F2

BX61	

Nortec 500

FR3220-IR

BX6OMF

MX-50A 

The DSX1000 digital microscope combines ease of use with advanced features to streamline your inspection workflow.

DSX1000

MX50A-873MD

MHL 110

SZ61

The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changes

MX50

MX50A-F

The STM6 series is a range of measuring microscopes from Olympus that offers more versatility and higher performance than ever before. The series features a wide range of models to meet various customer demands for new measuring capabilities and superior functionality. Some of the models in the range include the STM6-LM, which is designed for fast inspection of large samples, and the high-precision STM6, which has the most compact body in its class. The series also offers many optional units to ensure that every measurement need can be met. Some of the outstanding features of the STM6 series include motorized focusing, advanced UIS2 optics, a high-rigidity body with integrated counters, high-performance long-life LED illumination for bright and clear images, and much more. Overall, the STM6 series is a highly advanced and versatile range of measuring microscopes that offers exceptional levels of precision and durability.

STM6

The Olympus MX61 is a 200 mm semiconductor inspection microscope that provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. It is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution.

MX61

The Olympus LEXT OLS3000 is a confocal laser scanning microscope that was launched on January 26, 2004. It has the world’s highest resolution of 0.12µm, achieved by using a newly developed optical system optimized for a 408nm semiconductor laser. The microscope also allows for color 3D observations by integrating an optical system used for optical microscopes into the laser system

LEXT OLS3000

The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.

MX61L

"Semiconductor wafer inspection microscope (up to 200 mm) enabling
fast, accurate inspection via motorized aperture stop interlocked with
objective lens. Ergonomic design delivers operator comfort. SEMI S2/S8
compliance ensures safety and reliability."

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

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