说明
无说明配置
standard configuration, see specification X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).System is fully packed on pallette (241kg, 1mx0,9mx1,5m)OEM 型号描述
未提供文件
无文件
OXFORD
CMI 950
已验证
类别
Analytical
物品主要详细信息
状况：
未知
运行状况:
未知
产品编号：
12965
晶圆尺寸：
未知
年份：
2000
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
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OXFORD
CMI 950
已验证
类别
Analytical
上次验证： 60 多天前
物品主要详细信息
状况：
未知
运行状况:
未知
产品编号：
12965
晶圆尺寸：
未知
年份：
2000
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
standard configuration, see specification X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).System is fully packed on pallette (241kg, 1mx0,9mx1,5m)OEM 型号描述
未提供文件
无文件
类似上架物品
查看全部无类似上架物品