说明
CD SEM配置
NT Platform System Computer Dell Precision Work Station (Dual Core Processor) Raid Array (2 drive) OS – Windows NT 4.0 Main System Application – 6.1.SR2+ 3 Cassette Stations – Wafer 4” 5” 6” 8” Capable PRI Robot (with Class 1 wafer scanner) and Prealigner Electron Column – E Column Electron Source – Refurbished Scintillator Detector – New Energy Filter – Refurbished Wein Filter Apertures (2 each) – New Quick Pump (Optional)OEM 型号描述
The KLA-Tencor 8100XP CD SEM is a state-of-the-art scanning electron microscope used in semiconductor manufacturing. It enables precise and fast measurements of critical dimensions (CD) in small device geometries. The CD SEM has advanced capabilities for imaging and measuring high aspect ratio features, ensuring optimum device performance. It offers productivity-enhancing features such as high throughput, networking, offline recipe setup, and full system automation.文件
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KLA
8100XP
已验证
类别
CD-SEM
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
49393
晶圆尺寸：
4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
年份：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
8100XP
已验证
类别
CD-SEM
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
49393
晶圆尺寸：
4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
年份：
1998
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
CD SEM配置
NT Platform System Computer Dell Precision Work Station (Dual Core Processor) Raid Array (2 drive) OS – Windows NT 4.0 Main System Application – 6.1.SR2+ 3 Cassette Stations – Wafer 4” 5” 6” 8” Capable PRI Robot (with Class 1 wafer scanner) and Prealigner Electron Column – E Column Electron Source – Refurbished Scintillator Detector – New Energy Filter – Refurbished Wein Filter Apertures (2 each) – New Quick Pump (Optional)OEM 型号描述
The KLA-Tencor 8100XP CD SEM is a state-of-the-art scanning electron microscope used in semiconductor manufacturing. It enables precise and fast measurements of critical dimensions (CD) in small device geometries. The CD SEM has advanced capabilities for imaging and measuring high aspect ratio features, ensuring optimum device performance. It offers productivity-enhancing features such as high throughput, networking, offline recipe setup, and full system automation.文件
无文件