概述

The Table Top Shadow Moiré Metrology System with JEDEC Tray Autoloader (TTSM-J) provides ultra fast surface topography for up to two JEDEC trays full of samples. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for warpage in less than 2 seconds. Akrometrix’s suite of software programs to allow for a variety of useful features to optimize and provide meaningful reports. With high load repeatability or by using Akrometrix’s part tracking software, the TTSM-J can deliver high volume and high reliability component testing with multiple report output and pass/fail gauge options