COMPASS PRO 300
概述
Applied introduced the Compass Pro system in 2002 for detecting critical defects in devices with design rules as small as 100nm and below. The system operates with the high speed required for chipmakers' volume production lines, especially for copper-based chip manufacturing.
活动的上架物品
0
服务
检验、保险、评估、物流
热门上架物品
- 未找到产品