SEMVISION G10
概述
The SEMVision G10 is a defect analysis system developed by Applied Materials. It integrates novel cold field emission (CFE) technology and offers industry-leading, sub-1nm resolution to address many of today’s challenges. This high resolution is a critical enabler for EUV photoresist review at >10x reduced eBeam dose.
活动的上架物品
0
服务
检验、保险、评估、物流
热门上架物品
- 未找到产品