说明
FEI Company Expida 1285 (DA300)配置
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEM 型号描述
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.文件
无文件
类别
Defect Inspection
上次验证： 2 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
137369
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
EXPIDA 1285
类别
Defect Inspection
上次验证： 2 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
137369
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
FEI Company Expida 1285 (DA300)配置
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEM 型号描述
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.文件
无文件