跳至主要内容
Moov logo

Moov Icon

WI-2200

概述

The ICOS WI-2200/2300, which perform 100% automated optical inspection and metrology of microelectronic devices on a variety of wafer substrates. This inspection system combines surface inspection and 2D bump inspection for semiconductor ICs, optoelectronics, advanced packaging, and MEMS.

活动的上架物品

0

服务

检验、保险、评估、物流

热门上架物品

    未找到产品
有类似物品吗?
使用 Moov 上架,立即找到完美买家。