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说明
1 Fully Operational Defects and Classifies: -HDD sub-micron bits -Bumps -Particles -Buried defects on metal and glass Use Cases: -Defect inspection -Scratch and ridge inspection -Particle and stain inspection -Laser texture analysis -Carbon uniformity analysis and carbon void inspection -Recording layer and soft under layer mapping -Lube uniformity analysis配置
无配置OEM 型号描述
The Candela OSA 6100 is a system that introduces X-Beam channel technology, which adds radial illumination to the existing circumferential illumination design. It also features advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system is capable of simultaneously detecting and classifying defects such as particles, pits, and stains. Additionally, it can characterize lubricant thickness and use the Kerr Effect to characterize magnetic imaging.文件
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
84820
晶圆尺寸：
未知
年份：
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
CANDELA OSA-6100
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
84820
晶圆尺寸：
未知
年份：
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available