说明
Fully Refurbished & Calibrated Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included配置
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 0.2 µ Particle Size SensitivityOEM 型号描述
未提供文件
无文件
KLA
SURFSCAN 4500
已验证
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
110911
晶圆尺寸：
未知
年份：
1987
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
SURFSCAN 4500
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
110911
晶圆尺寸：
未知
年份：
1987
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Fully Refurbished & Calibrated Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included配置
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 0.2 µ Particle Size SensitivityOEM 型号描述
未提供文件
无文件