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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SURFSCAN SP3
    说明
    HD not included Good working condition Wafer Inspection System
    配置
    无配置
    OEM 型号描述
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    文件

    无文件

    KLA

    SURFSCAN SP3

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 29 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    105386


    晶圆尺寸:

    未知


    年份:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection
    年份: 2017状况: 二手
    上次验证29 天前

    KLA

    SURFSCAN SP3

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 29 天前
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/cdae5ed88a0f4aacabfc5e46cc924226_5_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/de11d5485f324c2e9f75537f1a547f84_3_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/6fe591cd23fb481d8a73a832cd193501_1_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/bb3f45609c314d11801e1e8cadcc4adb_2_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/20382d6aa95e45e5b5cc296750f1e94b_4_mw.jpg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    105386


    晶圆尺寸:

    未知


    年份:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    HD not included Good working condition Wafer Inspection System
    配置
    无配置
    OEM 型号描述
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    文件

    无文件

    类似上架物品
    查看全部
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection年份: 2017状况: 二手上次验证:29 天前
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection年份: 0状况: 翻新上次验证:60 多天前