说明
KLA Advanced Macro Inspection Module配置
无配置OEM 型号描述
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.文件
KLA
2900
已验证
类别
Defect Inspection
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
69546
晶圆尺寸：
12"/300mm
年份：
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
2900
已验证
类别
Defect Inspection
上次验证： 19 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
69546
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available