ALERIS 8330
概述
The AlerisTM 8330 film metrology system, a targeted solution for production monitoring of the thickness, refractive index and stress of non-critical films at the 32nm node and beyond.
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The AlerisTM 8330 film metrology system, a targeted solution for production monitoring of the thickness, refractive index and stress of non-critical films at the 32nm node and beyond.
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检验、保险、评估、物流