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ADVANTEST T5377
    说明
    Memory Tester
    配置
    Memory Tester
    OEM 型号描述
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
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    ADVANTEST

    T5377

    verified-listing-icon

    已验证

    类别
    Final Test

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    90926


    晶圆尺寸:

    未知


    年份:

    2003

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    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final Test
    年份: 2003状况: 二手
    上次验证60 多天前

    ADVANTEST

    T5377

    verified-listing-icon
    已验证
    类别
    Final Test
    上次验证: 60 多天前
    listing-photo-68c0e740b4bb478bbe38d7235b227bcd-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    90926


    晶圆尺寸:

    未知


    年份:

    2003


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Memory Tester
    配置
    Memory Tester
    OEM 型号描述
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    文件

    无文件

    类似上架物品
    查看全部
    ADVANTEST T5377

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    Final Test年份: 2009状况: 二手上次验证: 60 多天前
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