概述

Flash memory semiconductors require more types of front-end testing than other types of semiconductors. Advantest's front-end test system for flash memory semiconductors is the T5724. The T5724 is capable of simultaneously testing up to 2,048 flash memory semiconductors with the Built-in-Self-Test, or BIST, function, which is sixteen times greater than the capability of previous models, and significantly lower test costs. The increase in capability is dues to the T5724's use of a probe card that allows for aggregate wafer contact which increases test speed.