Keysight Technologies, Inc. provides electronic design and test solutions to commercial communications, networking, aerospace, defense and government, automotive, energy, semiconductor, electronic, and education industries in the Americas, Europe, and the Asia Pacific.

The Agilent 4073A ultra advanced parametric tester with Agilent SPECS is designed to perform highly precise DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-resolution SMUs (HRSMUs), and two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.

KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

4073A

4073B

The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.

4072B

4062UX

The standard system cabinet contains the 4072A/4073A tester system instruments and is 1.6 m (5.3 ft.) high. The standard cabinet has an emergency off (EMO) unit. The 4072A/4073A tester requires single phase power configuration with protective earth. Its line voltage is 200, 208, 220, or 240 Vac, and line frequency is 50 or 60 Hz. The line voltage and frequency are selected by specifying options. The system cabinet for the 4072A/4073A tester is equipped with a power distribution unit (PDU) for each line voltage. The rated current of the PDU is 20 A for 200/220/240 Vac, and 24 A for 208 Vac. The short circuit current rating is 5 kA for 200/220/240 Vac, and 10 kA for 208 Vac.

4072A	

The Agilent 3070 Series 3 in-circuit board testers are designed to meet the challenges of today's manufacturing environment. With probe-free coverage and diagnostics, these testers offer easy test development for complex boards with limited probe access. Achieve faster testing and eliminate hidden costs with productivity tools. The high-speed flash programming solution brings efficiency to your production line and improves your bottom line. Fulfill high volume requirements and exceed customer expectations while maintaining profitability.

3070 SERIES 3

4062

Semiconductor Parameter Analyzer
Quickly evaluate semiconductor performance. 
Make go/no go tests at incoming inspection.
Evaluate semiconductors in circuit design lab.
Solve semiconductor-related production problems.

4145B

41501B Pulse Generator and Expander Unit for the 4155C/4156C

41501B 

3070 SERIES 2

4156C Precision Semiconductor Parameter Analyzer

4156C

3070 Series 1

4142B

Semiconductor Parameter Analyzer
The 4145A stimulates voltage and current sensitive devices and measures resulting current and voltage responses. The 4145A also performs mathematical operations on measurement data. This adds up to fast, accurate analysis of semiconductor devices leading to increased productivity and improved quality.

4145A

9490XL	

4062C

4155C

4279A

Medalist i3070 Series 5 In-Circuit Test System
The Medalist i3070 Series 5 Board Test Family is the broadest and most compatible family of board test systems available on the market today . Designed to handle a wide variety of test strategies, technologies, printed circuit boards (PCBs), and budgets, the Medalist i3070 Series 5 family offers a specific test system to fit your exact requirements. The systems can be expanded in both hardware and software capabilities to meet future growth needs 

i3070 SERIES 5

The B1500A Semiconductor Device Analyzer is a versatile instrument that integrates multiple measurement and analysis capabilities for accurate and quick device characterization. It provides a wide range of device characterization capabilities, uncompromised measurement reliability, and repeatability. This single-box solution covers all your device characterization needs, from fundamental current-voltage and capacitance-voltage characterization to advanced ultra-fast IV testing. Its modular architecture allows for easy expansion or upgrades, and the included EasyEXPERT software enables efficient and repeatable device characterization. Accelerate your device characterization with the B1500A Semiconductor Device Analyzer.

B1500A	

4140B

8114A High Power Pulse Generator, 100 V / 2 A

B1104A

4062F

3170 SERIES 3

4082F Flash Memory Cell Parametric Test System supports the high-voltage semiconductor pulse generator (HV-SPGU) modules and 81150A pulse generator to characterize flash memory cell technologies. 

4082F

41422A

The 4083A supports an Keysight PNA Network Analyzer for highfrequency S-parameter measurements up to 20 GHz, easily meeting the testing needs of modern RF devices. To help those unfamiliar with RF measurement, the 4083A is furnished with a library of both RF and RFCV algorithms. The 4083A is also the first  production parametric tester to offer an 8 x10 RF matrix option integrated in the testhead that supports 20 GHz measurements. With the ability to measure up to five RF test structures in a single touchdown, the 4083A RF matrix both improves measurement throughput and increases probe card lifetime by reducing contact wear-and-tear.

4083A

41000

The Keysight i3070 Series 6 In-Circuit Test (ICT) system is designed to bring industryleading in-circuit testing technologies into your Printed Circuit Board Assembly (PCBA) manufacturing. This system is Industrial 4.0 ready and caters to in-circuit testing for a wide range of PCBA sizes and applications such as Internet of Things, 5G Communication, Automotive and Energy

i3070 SERIES 6

Agilent Medalist 5DX Series 5000 Automated X-Ray Inspection (AXI)
Joint Pitch Model 5400: 0.2 mm & up (0.008 in & up)

Medalist 5DX: 5400

4070

 Precision Semiconductor Parameter Analyzer

4156B 

41423A

5DX SERIES 5000

4082A Parametric Test System covers the essential parametric tests for mature and advanced semiconductor devices and has synchronous and asynchronous parallel test capabilities.

4082A

5DX SERIES 2L

Semiconductor test systems modular dc source/monitor  

41420A

i3070 Series 5i Inline In-Circuit Test Systems
The Keysight i3070 Series 5i Inline In-Circuit Test (ICT) system is designed to bring industry-leading ICT technologies into your fully automated manufacturing line. This flexible system caters to in-circuit testing for a wide range of board sizes. It can be scaled to match the number of nodes required and can be seamlessly integrated into a handler-tester design. Three models are available to suit different manufacturing requirements:– 2-module Standard– 2-module Lean– 4-module 

i3070 SERIES 5i

4062A Semiconductor Parametric Test System 

4062A

4062B

The HP 4141B DC Source / Monitor is designed for use as a system component in user-designed semiconductor I-V or DC parametric test systems. With its wide DC measurement range, high resolution, high-speed measurement capabilities, remote sensing, and high accuracy, the HP 4141B will contribute towards quality improvement and increased measurement throughput in the lab or on the production line.

4141B

Keysight 4080 Series offers a wide range of measurement capabilities required for the fundamental parametric tests. You can easily perform DC and capacitance measurements such as Vth, Ids, Idoff, and Cox, to name just a few. 4080 Series supports three types of SMU (Source Monitor Unit) for DC measurement. Several other instrument options, such as a digital voltmeter(DVM), a spectrum analyzer, and an LCD meter, provide enhanced measurement capabilities.

4080

MEDALIST x6000

HP 4155A Semiconductor Parameter Analyzer

4155A

5DX SERIES II

5DX SERIES 3

4071A	

Precision Semiconductor Parameter Analyzer

4156A	

The Agilent Medalist i5000 provides broad test functionality in modular, scalable configurations, allowing the highest degree of operational flexibility in the ICT industry. This flexibility is vital to electronic manufacturers who need to quickly and accurately verify the quality of their PCBAs.

MEDALIST i5000

Model 4061A Semiconductor/Component Test System is a dedicated HP-IB system designed for automatic evaluation of semiconductor and electronic components. It is ideal for new component/material development, quality control, and early-stage semiconductor manufacturing. The 4061A excels in measuring a range of characteristics, such as doping profile, surface charge, density, minority carrier lifetime, and threshold voltage, alongside conventional impedance characteristics of electronic components. It includes software for seven typical applications and features a unique switching sub-system for easy measurement of both impedance and current characteristics without setup changes.

4061A

41421B

4155B

Agilent Medalist 5DX Series 5000 Automated X-Ray Inspection (AXI)
Minimum feature detection capability Joint pitch Model 5300: 0.3 mm & up (0.012 in & up) (3)

KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

概述

活动的上架物品

总产品

服务

热门 KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) Final Test

4073A

4073B

4072B

4062UX

使用 Moov 上架，立即找到完美买家。

全部 KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) Final Test