概述

The Fusion High Functionality ("HF") test head contains high pin count digital and mixed signal technology to test all aspects of a system-on-a-chip device in a single insertion. The HF test head contains 32 mixed signal slots, 64 HiPer II digital pin slots and 8 radio frequency ("RF") or power module slots, thus enabling it to test both digital and analog signals. The HF test head can be configured with up to 1,024 digital pins. The HF can support a wide range of mixed signal test solutions such as RF, smart power, precision high voltage analog channels, precise timebase analyzers, powerful DSP-based synthesizer and digitizers for high-speed and high-resolution embedded converters.