概述

The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.