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UFLEX-XC
概述
UltraFLEX-XC is a 36-slot test system that offers three different test heads to optimize capital investment, footprint, and maximum number of instruments. All three test heads can use the same DIB (Device Interface Board), ensuring application portability and efficient instrumentation reuse and production flexibility. The test heads have a universal slot architecture, allowing any instrument to be placed in any slot.
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