概述

The MK.4TE ESD & Latch-Up Test System is a complete, robust and feature-filled turn-key instrumentation test package, which performs automatic and manual HBM, MM, and Latch-Up tests on devices with pin counts up to 2304 pins. It features the highest speed of test execution, lowest Zap interval, and extensive parallelism that enables concurrent Zapping with interleaved Trace test capability to global and company driven quality standards.