说明
无说明配置
2LP+1ChamberOEM 型号描述
The THERMAWAVE OP 5340 metrology system is used for complex thin film thickness measurement on 150mm, 200mm, and 300mm wafers. The THERMAWAVE OP 5340 has 65nm IC Production Accuracy. The THERMAWAVE OP 5340 is capable of directly interfacing with automated material handling systems. OP-5300 Series has expanded OP-5200 series wafer measurement capability to 300 millimeters.文件
无文件
KLA / THERMA-WAVE
OP-5340
已验证
类别
Metrology
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
47033
晶圆尺寸:
12"/300mm
年份:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / THERMA-WAVE
OP-5340
已验证
类别
Metrology
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
47033
晶圆尺寸:
12"/300mm
年份:
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
2LP+1ChamberOEM 型号描述
The THERMAWAVE OP 5340 metrology system is used for complex thin film thickness measurement on 150mm, 200mm, and 300mm wafers. The THERMAWAVE OP 5340 has 65nm IC Production Accuracy. The THERMAWAVE OP 5340 is capable of directly interfacing with automated material handling systems. OP-5300 Series has expanded OP-5200 series wafer measurement capability to 300 millimeters.文件
无文件
类似上架物品
查看全部无类似上架物品