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WYKO / VEECO SP 3200
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    配置
    Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
    OEM 型号描述
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    文件

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    WYKO / VEECO

    SP 3200

    verified-listing-icon

    已验证

    类别

    Profiler
    上次验证: 60 多天前
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    21924


    晶圆尺寸:

    未知


    年份:

    未知

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    WYKO / VEECO

    SP 3200

    verified-listing-icon

    已验证

    类别

    Profiler
    上次验证: 60 多天前
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/YnzC35xvfQtPT0qgi8jFbMkRBHwfnGVhFpvpzUNHIB4_20190301_114727_f
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/jlu6NgbV9WiCYOuBDCmnKzeDY_NNjcIHju813UL5m-A_20190301_114727_f
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    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/LU6a8k5oAB7S3OmgRUAKp5aQ3t24ALkzEdVz2pOmt7Q_20190301_114727_f
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/hw9uowZxeXCV7yxBD2P1BICPQNBrCuZ4prTS2Bjp-yQ_20190301_114727_f
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/Jqhe35_ahH2VpNQP19oZWclFkZknL6wFAzU0_5Y5k5Y_20190301_114727_f
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    21924


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
    OEM 型号描述
    未提供
    文件

    无文件

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