说明
无说明配置
• Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV • Milling Power: 21nA beam current • CDEM with 5nm image resolution • Windows OS and FEI UI • Five-axis motorized compucentric stage with load lock • Specimen Coverage: 100mm diameter • Load Lock • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free consisting IGP x 3, air cooled Turbo and dry PVPOEM 型号描述
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.文件
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
已验证
类别
Microscope
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
13114
晶圆尺寸:
未知
年份:
2015
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
类别
Microscope
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
13114
晶圆尺寸:
未知
年份:
2015
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
• Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV • Milling Power: 21nA beam current • CDEM with 5nm image resolution • Windows OS and FEI UI • Five-axis motorized compucentric stage with load lock • Specimen Coverage: 100mm diameter • Load Lock • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free consisting IGP x 3, air cooled Turbo and dry PVPOEM 型号描述
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.文件
无文件