说明
无说明配置
• Electron column with Schottky FEG, 350v-30kV • In lens SE and BSE detector • STEM • Magnum ion column, 5–30kV • Ga 69/71 LMIS • Milling Power: 21nA beam current and 100 A/cm² • CDEM • Windows OS and FEI UI; TSS networking computer to make IT happy • Five-axis motorized compucentric stage with 150mm load lock • XYZ: 100 x 100x 10 mm, piezo driven • T: – 10° to + 60°, Rotation: n x 360° • Flip stage with Omniprobe lift out • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free air-cooled turbo, IGP x 3, & dry PVPOEM 型号描述
The FEI Strata 400 STEM is a type of DualBeam™ system that combines the capabilities of a field emission scanning electron microscope (SEM) column with those of a focused ion beam (FIB) column to provide high-resolution, high-contrast imaging and specimen preparation. This system features complete in-situ sample preparation capabilities and high-resolution imaging, allowing TEM samples to be prepared without breaking vacuum. The Strata 400 STEM is specifically designed to meet the growing demand for high-resolution analytical capabilities as device geometries shrink below 100 nm and new materials are introduced. It includes integrated sample lift-out and handling, as well as SEM-STEM (scanning transmission electron microscopy) imaging, enabling high-contrast, high-resolution analysis.文件
无文件
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
STRATA 400 STEM
已验证
类别
Microscope
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
12435
晶圆尺寸：
未知
年份：
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
STRATA 400 STEM
已验证
类别
Microscope
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
12435
晶圆尺寸：
未知
年份：
2004
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
• Electron column with Schottky FEG, 350v-30kV • In lens SE and BSE detector • STEM • Magnum ion column, 5–30kV • Ga 69/71 LMIS • Milling Power: 21nA beam current and 100 A/cm² • CDEM • Windows OS and FEI UI; TSS networking computer to make IT happy • Five-axis motorized compucentric stage with 150mm load lock • XYZ: 100 x 100x 10 mm, piezo driven • T: – 10° to + 60°, Rotation: n x 360° • Flip stage with Omniprobe lift out • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free air-cooled turbo, IGP x 3, & dry PVPOEM 型号描述
The FEI Strata 400 STEM is a type of DualBeam™ system that combines the capabilities of a field emission scanning electron microscope (SEM) column with those of a focused ion beam (FIB) column to provide high-resolution, high-contrast imaging and specimen preparation. This system features complete in-situ sample preparation capabilities and high-resolution imaging, allowing TEM samples to be prepared without breaking vacuum. The Strata 400 STEM is specifically designed to meet the growing demand for high-resolution analytical capabilities as device geometries shrink below 100 nm and new materials are introduced. It includes integrated sample lift-out and handling, as well as SEM-STEM (scanning transmission electron microscopy) imaging, enabling high-contrast, high-resolution analysis.文件
无文件
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