说明
无说明配置
- Workstation with Windows XP - xT software version 5.x - Support PC with Windows XP - 2 x 24 '' widescreen LCD monitor - Elstar electron column with UC technology - Tomahawk ion column with fast ion beam blanker - 150 x 150 mm eucentric stage - Beam deceleration mode - In-lens detector TLD - with SE and BSED modes - Secondary electron detector (SED) - In-column detectors: iCD and Mirror detector - Beam current measurement - CCD IR camera - Integrated plasma cleaner - Oil-free pumping system - Large table top with support The main unit of the microscope consisting of: - Piezo table, XY travel 150mm - Beam deceleration mode - Intralens detector - Column detector: collection of secondary electrons with energy of low kV in the mode beam deceleration - measurement of the beam current - Built-in plasma cleaner AutoFIB / FIB control automation software package Automation License AutoSlice and View G3 / Sequential Cutting and Sample Observation Automation Suite AutoSlice and View G3 Extended Package AutoTEM G2 / TEM sample preparation automation software Correlative Workflow / Software suite for combining mosaics of images from different sources iFast Developers Kit Community / Automation package for many functions of microscope tools Maps Tiling & Stitching NanoArchitect / NanoBuilder / Tool for the systematic planning of the creation of multilayer nanostructures Acoustic Enclosure for Pre-vacuum Pump Compressor 230 V, 50/60 Hz with 4-liter Tank / Compressor Thermoflex Chiller 50 Hz / Cooler 6-Channel Detector Amplifier / 6-Channel Preamplifier ICE Detector / Collection of secondary ions and electrons Retractable DBS Detector Retractable STEM 3+ Detector System Covers for Helios NanoLab / Plastic cover for the microscope column FEI EasyLift EX NanoManipulator Platinum Deposition (Pt) CryoCleaner EC / Microscope chamber contamination reduction system (so called cold finger) CryoCleaner EC Spare Vessel / Nav-Cam + / Optical sample observation camera inside the microscope chamber Fast Electron Beam Blanker FEI Navigator Software Manual User Interface Quick Loader Quick Loader Compatible STEM Holder UMB FIB / TEM Specimen Kit / Set of special holders for TEM samples UMB Specimen Holder Kit TEAM EDS Enhanced Analysis System consisting of: Octane Pro EDS detector (10 mm2) with Team Enhanced EDS software and 129 eVOEM 型号描述
The Helios NanoLab 660 is a state-of-the-art DualBeam system developed by FEI. It combines the power of both ion and electron beams to provide FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) capabilities in a single machine. This system is designed to provide detailed, multi-dimensional insights at a sub-nanometer resolution. It incorporates the latest advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies, allowing for their combined use. As the 11th DualBeam platform from FEI, the Helios NanoLab 660 opens up new possibilities for extreme high-resolution 2D and 3D characterization, nanoprototyping, and high-quality sample preparation.文件
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 660
已验证
类别
Microscope
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
46831
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 660
已验证
类别
Microscope
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
46831
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
- Workstation with Windows XP - xT software version 5.x - Support PC with Windows XP - 2 x 24 '' widescreen LCD monitor - Elstar electron column with UC technology - Tomahawk ion column with fast ion beam blanker - 150 x 150 mm eucentric stage - Beam deceleration mode - In-lens detector TLD - with SE and BSED modes - Secondary electron detector (SED) - In-column detectors: iCD and Mirror detector - Beam current measurement - CCD IR camera - Integrated plasma cleaner - Oil-free pumping system - Large table top with support The main unit of the microscope consisting of: - Piezo table, XY travel 150mm - Beam deceleration mode - Intralens detector - Column detector: collection of secondary electrons with energy of low kV in the mode beam deceleration - measurement of the beam current - Built-in plasma cleaner AutoFIB / FIB control automation software package Automation License AutoSlice and View G3 / Sequential Cutting and Sample Observation Automation Suite AutoSlice and View G3 Extended Package AutoTEM G2 / TEM sample preparation automation software Correlative Workflow / Software suite for combining mosaics of images from different sources iFast Developers Kit Community / Automation package for many functions of microscope tools Maps Tiling & Stitching NanoArchitect / NanoBuilder / Tool for the systematic planning of the creation of multilayer nanostructures Acoustic Enclosure for Pre-vacuum Pump Compressor 230 V, 50/60 Hz with 4-liter Tank / Compressor Thermoflex Chiller 50 Hz / Cooler 6-Channel Detector Amplifier / 6-Channel Preamplifier ICE Detector / Collection of secondary ions and electrons Retractable DBS Detector Retractable STEM 3+ Detector System Covers for Helios NanoLab / Plastic cover for the microscope column FEI EasyLift EX NanoManipulator Platinum Deposition (Pt) CryoCleaner EC / Microscope chamber contamination reduction system (so called cold finger) CryoCleaner EC Spare Vessel / Nav-Cam + / Optical sample observation camera inside the microscope chamber Fast Electron Beam Blanker FEI Navigator Software Manual User Interface Quick Loader Quick Loader Compatible STEM Holder UMB FIB / TEM Specimen Kit / Set of special holders for TEM samples UMB Specimen Holder Kit TEAM EDS Enhanced Analysis System consisting of: Octane Pro EDS detector (10 mm2) with Team Enhanced EDS software and 129 eVOEM 型号描述
The Helios NanoLab 660 is a state-of-the-art DualBeam system developed by FEI. It combines the power of both ion and electron beams to provide FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) capabilities in a single machine. This system is designed to provide detailed, multi-dimensional insights at a sub-nanometer resolution. It incorporates the latest advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies, allowing for their combined use. As the 11th DualBeam platform from FEI, the Helios NanoLab 660 opens up new possibilities for extreme high-resolution 2D and 3D characterization, nanoprototyping, and high-quality sample preparation.文件
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