概述

The JSPM-5400 is a versatile scanning probe microscope that offers high-speed, non-damaging scan control, and high-resolution imaging. It’s designed for stable observation of heated or cooled samples in high vacuum. Its patented non-contact AFM uses a constant excitation amplitude FM detection method for accurate surface-potential imaging. This results in high-resolution imaging in a vacuum, with no air resistance or adsorption of impurities on sample surfaces. It also features automatic vertical drift correction due to temperature change. Optional accessories include an airlock specimen exchange, a liquid nitrogen cold trap for high vacuum, and sample heating/cooling devices.