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VEECO DIMENSION 5000
    说明
    No missing parts
    配置
    无配置
    OEM 型号描述
    The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
    文件

    无文件

    类别
    Microscope

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    Installed / Running


    产品编号:

    101130


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    VEECO

    DIMENSION 5000

    verified-listing-icon
    已验证
    类别
    Microscope
    上次验证: 60 多天前
    listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/ad83d40e55c646179b2b7ee9c00d2396_00517dbc457d4e7eb9580eb1ffb0c5431201a_mw.jpeg
    listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/015631599d754a1c8756769bbe9dcc89_cc2e8761e41d40fa98a864fa4bc406961201a_mw.jpeg
    listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/f4ff31ef369d418bbb713d32df021062_0ac358c7bb944955a54d53b0b9cf92e21201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    Installed / Running


    产品编号:

    101130


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    No missing parts
    配置
    无配置
    OEM 型号描述
    The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
    文件

    无文件