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VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
说明
No missing parts
配置
无配置
OEM 型号描述
The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
文件

无文件

类别
Microscope

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

Installed / Running


产品编号:

101130


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

VEECO

DIMENSION 5000

verified-listing-icon
已验证
类别
Microscope
上次验证: 60 多天前
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/ad83d40e55c646179b2b7ee9c00d2396_00517dbc457d4e7eb9580eb1ffb0c5431201a_mw.jpeg
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/015631599d754a1c8756769bbe9dcc89_cc2e8761e41d40fa98a864fa4bc406961201a_mw.jpeg
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/f4ff31ef369d418bbb713d32df021062_0ac358c7bb944955a54d53b0b9cf92e21201a_mw.jpeg
物品主要详细信息

状况:

Used


运行状况:

Installed / Running


产品编号:

101130


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
No missing parts
配置
无配置
OEM 型号描述
The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
文件

无文件