跳至主要内容
Moov logo

Moov Icon

EG6000e

类别
Probers
概述

Parametric Probers: The EG6000e, introduced in December 2005 is targeted at the parametric test (“e-test”) segment of the wafer probe market. This system incorporates patented technology licensed from, Cascade Microtech, Inc. This technology allows extremely precise, low-level electrical measurements to be made at the wafer level. This type of electrical measurement performance is becoming increasingly critical for advanced sub-micron semiconductor processes.

活动的上架物品

0

服务

检验、保险、评估、物流

热门上架物品

    未找到产品
有类似物品吗?
使用 Moov 上架,立即找到完美买家。