说明
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.配置
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM 型号描述
未提供文件
无文件
AMBIOS TECHNOLOGY, INC
XP-2
已验证
类别
Profiler
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
53545
晶圆尺寸：
未知
年份：
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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AMBIOS TECHNOLOGY, INC
XP-2
已验证
类别
Profiler
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
53545
晶圆尺寸：
未知
年份：
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.配置
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM 型号描述
未提供文件
无文件
类似上架物品
查看全部无类似上架物品