说明
No missing parts System was shutdown according to normal procedure Stage air bearing was damaged before shutting down配置
LDS3300M Macro-Module 30um Head - sensitivity for surface defects down to 10um 100% Wafer Surface Inspection 200mm+300mm - Bare & Pattern Wafers Throughput 200mm - 140 WPH 300mm - 130 WPHOEM 型号描述
未提供文件
无文件
KLA / VISTEC / LEICA
LDS 3300M
已验证
类别
Reticle / Mask Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
23604
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部
KLA / VISTEC / LEICA
LDS 3300M
类别
Reticle / Mask Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
23604
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
No missing parts System was shutdown according to normal procedure Stage air bearing was damaged before shutting down配置
LDS3300M Macro-Module 30um Head - sensitivity for surface defects down to 10um 100% Wafer Surface Inspection 200mm+300mm - Bare & Pattern Wafers Throughput 200mm - 140 WPH 300mm - 130 WPHOEM 型号描述
未提供文件
无文件