概述

The Nova NanoSEM 230 is a scanning electron microscope that offers enhanced capabilities compared to its predecessor. It excels in low and very low kV characterization and has improved analytical capabilities. With the Nova NanoSEM 230, it is possible to access sub-100V imaging with high surface sensitivity, achieve superb low kV BSE, and perform faster analysis. In summary, the Nova NanoSEM 230 is a powerful tool for low kV characterization and analysis.