Tailored for the mainstream need to investigate a wide variety of materials and characterize their structure and composition, the easy to use Inspect™ F50 provides a high resolution, stable platform to handle most research needs. The easy-to-use interface provides accurate and fast data collection: surface and compositional images combined with fast elemental analysis for determining material properties and elemental composition. In many areas the value of a FEG SEM for high resolution and high current helps meet the challenges to produce top quality images and fast analysis. The Inspect F50 is the perfect, flexible solution for these basic research applications.

Thermo Fisher Scientific Inc. (NYSE: TMO), the world leader in serving science, today announced that it has completed its acquisition of FEI Company, Inc. (NASDAQ: FEIC), the leader in high-performance electron microscopy. FEI and Philips joined their technologies in 1993 to create the first DualBeam (FIB/SEM) workstation.

THERMOFISHER SCIENTIFIC / FEI / PHILIPS

For high-brightness, high-current, high-resolution imaging, the Inspect F50 , a SEM equipped with a Schottky Field Emission source, provides clear, sharp and noise-free imaging. In combination with the optimized analytical chamber geometry and its four-axis, motorized tilt, eucentric specimen stage, the high- and stable beam current makes this tool well suited for (automated) short- and long-time EDS, WDS and EBSD analysis and mapping. The system's excellent lateral resolution enables easy detection of low-Z elements at low beam energies, adding value and flexibility to the Inspect F50.

THERMOFISHER SCIENTIFIC / FEI / PHILIPS

INSPECT F50

SEM / FIB

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INSPECT F50

SEM / FIB

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