Thermo Fisher Scientific Inc. (NYSE: TMO), the world leader in serving science, today announced that it has completed its acquisition of FEI Company, Inc. (NASDAQ: FEIC), the leader in high-performance electron microscopy. FEI and Philips joined their technologies in 1993 to create the first DualBeam (FIB/SEM) workstation.

THERMOFISHER SCIENTIFIC / FEI / PHILIPS

The XL30 SFEG is a high-resolution SEM produced by ThermoFisher (previously known as FEI). It is a versatile instrument for advanced research in fields such as materials science, semiconductors, electronic devices, failure analysis, and life science. The microscope employs a Schottky-type field emission source and supports a broad range of accelerating voltages from 200 V to 30 kV. It can achieve resolutions of 1.5 nm at > 10 kV and 2.5 nm at 1 kV. The microscope is equipped with a full set of detectors for imaging in secondary and back-scattered electrons, including a Through-the-Lens detector with variable bias for high-resolution observation. The system is designed for operation at low kV, allowing uncoated and insulating materials to be examined with minimal charging. The XL30 SFEG also offers high spatial resolution structural research and high-resolution analytical work with techniques such as EDS, CL, EBSD, and EBIC.

THERMOFISHER SCIENTIFIC / FEI / PHILIPS

XL30 SFEG

SEM / FIB

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XL30 SFEG

SEM / FIB

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