概述

The FEI (Philips) XL30 TMP is a traditional scanning electron microscope (SEM) from the XL Series that is versatile and suitable for a wide range of applications. It delivers exceptional performance for both imaging and micro-analysis of conductive and/or coated samples, making it ideal for specialized research in metallography as well as routine tasks such as monitoring manufacturing processes. The XL30 TMP has an electron optical column with a conical final lens and a fixed final lens aperture, which is designed for high-resolution imaging, X-ray microanalysis, and low magnification performance. The system also features extensive automation and user-friendly software control, making it an excellent tool for both novice and experienced users.