概述

The Thermo Scientific™ Helios™ 5 HX DualBeam continues the Helios DualBeam legacy to the fifth generation by combining the innovative Thermo Scientific™ Elstar™ Electron Column with UC+ technology for high-resolution and high materials contrast imaging and the superior low-kV performance of the Thermo Scientific™ Phoenix™ Ion Column for fast, precise and sub-nm damage sample preparation. In addition to the industry leading SEM and FIB columns, the Helios 5 HX DualBeam incorporates a suite of state-of-the-art technologies that enable simple and consistent sample preparation for high-resolution TEM imaging on even the most challenging samples.