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市场 > SEM / FIB > HITACHI > SU8240

SU8240

类别
SEM / FIB
概述

The ultimate SEM electron source now offers high signal to noise )S/N0 and uncompromising resolutions with beam current and stability, which is critical for analytical solutions. The robust SU8200 series supports a wide variety of applications within material research ‘ development and industrial quality control environments

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