概述

The JSM-5800LV is a versatile, high-performance scanning electron microscope. It delivers a high resolution of 3.5nm, and 5.5nm in Low Vacuum (LV) mode, which is ideal for observing specimens with high water content or non-conductive surfaces. The microscope’s specimen chamber can hold up to an 8-inch diameter specimen and offers automated features like Auto Focus/Stigmator and Automatic Contrast/Brightness. It provides a user-friendly interface with two 12-inch CTRs for high-quality digital imaging. Additional features include color display for secondary electron and backscattered electron images, a fully automated five-axis eucentric specimen stage, digital raster rotation, and on-board image archiving. The JSM-5800LV is widely used across various applications and offers numerous options for increased versatility.