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市场 > SEM / FIB > JEOL > JSM-6380LV

JSM-6380LV

类别
SEM / FIB
概述

The JSM-6380LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.

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