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说明
-2007 Vintage -Sample wafer holders not included配置
-Cold field emission SEM, with detectors for SE, BSE and low angle BSE Including Loadlock and EDS (LN2 cooled). -Low voltage SEM. Possible acceleration voltages 0.1-30 kV. -Cross section inspection: up to 1.5 cm -Top down inspection: Wafers up to 2" -Windows XP PC and software needs to be upgradedOEM 型号描述
未提供文件
无文件
类别
SEM / FIB
上次验证： 20 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121169
晶圆尺寸：
未知
年份：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-7500FA
类别
SEM / FIB
上次验证： 20 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121169
晶圆尺寸：
未知
年份：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
-2007 Vintage -Sample wafer holders not included配置
-Cold field emission SEM, with detectors for SE, BSE and low angle BSE Including Loadlock and EDS (LN2 cooled). -Low voltage SEM. Possible acceleration voltages 0.1-30 kV. -Cross section inspection: up to 1.5 cm -Top down inspection: Wafers up to 2" -Windows XP PC and software needs to be upgradedOEM 型号描述
未提供文件
无文件