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ZEISS /LEO 1455
    说明
    LEO Scanning Electron Microscope (Parts only)
    配置
    无配置
    OEM 型号描述
    SEM feature extra-large chambers for the non-destructive examination of large samples
    文件

    无文件

    ZEISS /LEO

    1455

    verified-listing-icon

    已验证

    类别
    SEM / FIB

    上次验证： 60 多天前

    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    116674

    晶圆尺寸：

    6"/150mm

    年份：

    未知

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    ZEISS /LEO 1455

    ZEISS /LEO

    1455

    SEM / FIB
    年份： 0状况： 二手
    上次验证60 多天前

    ZEISS /LEO

    1455

    verified-listing-icon
    已验证
    类别
    SEM / FIB
    上次验证： 60 多天前
    listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/7d426fb981f042aa984d5eccf96fe540_97126791e15d4eff976862694cced86245005c_mw.jpeg
    listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/501a377d84aa4c0abd857115dd3231d6_959496be79d94b2896c4a5791ea58b80_mw.jpeg
    listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/29d2502418414c2fb8d6629defcd4059_90b1225f192f4ee9a468137c8b61d3241201a_mw.jpeg
    listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/4d4a693d127e41abb08f538df286daeb_a3e0f9b95c914ac48a485c1a3eb8b34a1201a_mw.jpeg
    listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/d1ba609d4f9d48f987531f94161fe853_47af99fce8cc4b35abb769026dbcefb31201a_mw.jpeg
    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    116674

    晶圆尺寸：

    6"/150mm

    年份：

    未知

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    LEO Scanning Electron Microscope (Parts only)
    配置
    无配置
    OEM 型号描述
    SEM feature extra-large chambers for the non-destructive examination of large samples
    文件

    无文件

    类似上架物品
    查看全部
    ZEISS /LEO 1455

    ZEISS /LEO

    1455

    SEM / FIB年份： 0状况： 二手上次验证：60 多天前