说明
LEO Scanning Electron Microscope (Parts only)配置
无配置OEM 型号描述
SEM feature extra-large chambers for the non-destructive examination of large samples文件
无文件
LEO
1455
已验证
类别
SEM / FIB
上次验证: 7 天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
116674
晶圆尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
LEO
1455
类别
SEM / FIB
上次验证: 7 天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
116674
晶圆尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
LEO Scanning Electron Microscope (Parts only)配置
无配置OEM 型号描述
SEM feature extra-large chambers for the non-destructive examination of large samples文件
无文件