FEl's Altura- 855 offers the ultimate tools for defect characterization, failure analysis, and TEM sample preparation on
patterned and unpatterned wafers, as well as piece parts.

Thermo Fisher Scientific Inc. (NYSE: TMO), the world leader in serving science, today announced that it has completed its acquisition of FEI Company, Inc. (NASDAQ: FEIC), the leader in high-performance electron microscopy. FEI and Philips joined their technologies in 1993 to create the first DualBeam (FIB/SEM) workstation.

ALTURA 855

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