说明
无说明配置
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEM 型号描述
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.文件
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HITACHI
S-4700 II
已验证
类别
SEM
物品主要详细信息
状况:
Refurbished
运行状况:
未知
产品编号:
23124
晶圆尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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S-4700 II
已验证
类别
SEM
上次验证: 60 多天前
物品主要详细信息
状况:
Refurbished
运行状况:
未知
产品编号:
23124
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEM 型号描述
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.文件
无文件