说明
无说明配置
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM 型号描述
未提供文件
无文件
HITACHI
S-5200
已验证
类别
SEM
物品主要详细信息
状况:
Used
运行状况:
Installed / Running
产品编号:
96224
晶圆尺寸:
未知
年份:
未知
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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S-5200
已验证
类别
SEM
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
Installed / Running
产品编号:
96224
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM 型号描述
未提供文件
无文件