JEOL

JSM 6400

JSM-6600F

JWS 7550

JSM-6700F

JSM 5900LV

JWS 7500E

JWS-7555

The JSM-7600F is a state-of-the-art Scanning Electron Microscope (SEM) that combines ultra-high-resolution imaging with enhanced analytical capabilities. It boasts a resolution of 1.5 nm at 1 kV in GB mode and 1.0 nm at 15 kV, with an accelerating voltage ranging from 0.1 kV to 30 kV. The microscope offers a magnification range from 25x to 1,000,000x, providing ultra-high-resolution imaging comparable to cold FEG SEM. This SEM is equipped with an in-lens thermal FE gun and an aperture angle control lens, ensuring optimum beam projection regardless of the probe current level. It also offers robust analytical capabilities at a maximum probe current of 200 nA at 15 kV, supporting various types of sample analysis such as WDS and EDC. The JSM-7600F features an r-filter for controlling the energy selection and image mixture rate for secondary electron and backscattered electron images. Its Gentle Beam mode minimizes beam damage for ultra-surface imaging. Designed with energy efficiency and environmental friendliness in mind, this powerful FE-SEM is a valuable tool for any laboratory.

JSM-7600F

JSM-6360LV

JWS 7505

JSM 5610

JSM-5600

Suitable for a wide range of applications, the JSM-5800 from JEOL represents a new era in scanning microscopy. Now you have the option to choose either mouse or knobset control, while taking advantage of the super conical objective lens designed for the highest resolution (3.5nm} and large sample tilting.

JSM-5800

JWS-7855S

JSM 6510

JWS-7515

JSM 7500F

JSM 5910

JSM-6400F

JSM 6300F

JSM-840A

JSM 7401F

JWS-2000

Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.

JSM-6490LV

JFS 9855S

JSM 7000F

JSM 5310

 JSM 6301

The JSM-6380LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.

JSM-6380LV

Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.

JSM-6510LV

JXA 8800L	

JSM 6480LV

JSM 6340F

JSM 840

JSM 5900

Field Emission Electron Probe Microanalyzer

JXA-8530F

JSM 6380A

JFS-9955S

JSM-7400F

Field Emission Scanning Electron Microscope (FESEM)

JSM-7800F

JSM 6510LA

JSM 6400FV

The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.

JEM-2010F

JSM 5610LV

JSM 6060

JSM-6500F

JFS 9815

JSM 6060LV

JXA 8900RL

JWS-8000Z

JSM-6100

JWS-7555S

JSM 5600LV

JSM 6600

JSM-6701F

The JSM-6320F is a high-performance, ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) that operates at low to medium accelerating voltages. It features a “semi-in-lens” design and a “through-the-lens” detector, delivering a high resolution of 1.2nm (or 2.5nm at 1kV). The microscope can accommodate specimens up to 100mm in diameter in its chamber. The device is equipped with a JEOL conical FE electron gun and a double zoom condenser lens, ensuring a stable and high-performance electron optical system. It also offers dual imaging capabilities, providing rapid response with analog imaging and superior image quality with digital imaging. The JSM-6320F is user-friendly, featuring various auto functions for ease of operation. Its digital image memory enhances its functionality by allowing image storage, comparisons, and noise reduction through accumulated TV rate images. This makes it an ideal tool for detailed examination and analysis in various fields.

JSM-6320F

JCM-7000

Ultra-High Resolution Field Emission Scanning Electron Microscope

JSM-IT800

JSM 35CF

JSM-5500LV

JSM-6460

JSM 7100FLV

JEM-ARM200CF Super X	

The JSM-5800LV is a versatile, high-performance scanning electron microscope. It delivers a high resolution of 3.5nm, and 5.5nm in Low Vacuum (LV) mode, which is ideal for observing specimens with high water content or non-conductive surfaces. The microscope’s specimen chamber can hold up to an 8-inch diameter specimen and offers automated features like Auto Focus/Stigmator and Automatic Contrast/Brightness. It provides a user-friendly interface with two 12-inch CTRs for high-quality digital imaging. Additional features include color display for secondary electron and backscattered electron images, a fully automated five-axis eucentric specimen stage, digital raster rotation, and on-board image archiving. The JSM-5800LV is widely used across various applications and offers numerous options for increased versatility.

JSM-5800LV

JSM 6360

JSM-6490

JSM-6390

JSM 7610 PLUS

JFS 6600F-XV

JSM-5200

JCM-5000

JASM-6200

JEM-ARM200CF

JSM 7001FLV

JSM  5910LV

JSM-5400

JSM T330A

JXA 840

JSM 6610A

JSM 5300LV

JSM-6490A

JSM 6610LV

JSM-7001F

JSM 7100F

"The JSM-6300, a top-of-the-line research-grade SEM, combines advanced digital technology with automated features for effortless operation. With a newly developed super conical corrected field objective lens and 3.5 nm resolution, it excels as an analytical SEM. Accommodating specimens up to 150mm in diameter, it offers versatility.

Transform the JSM-6300 into a full-blown EPMA with various analytical attachments, supporting up to 3 WDS and 1 EDS X-ray Spectrometers. Benefit from the dual operation panel, providing rapid response (analog) and superior image quality (digital).
Specifications:
Resolution (secondary electron image): 3.5 nm
Accelerating voltage: 0.2 to 5 kV (100 V steps) / 5 to 30 kV (1 kV steps)
Magnification: x 10 to 300,000
Probe current: 10-12 to 10-5A
Image modes: SEI, BEI (TOPO and COMPO), ECP
Specimen stage: Eucentric goniometer (X=50mm, Y=70mm, Z=40mm - fine Z movement -3 to +2mm, T=-5 to 90°, R=360° endless)
Auto functions: AFD, ACB, ASD, AFD + ACB, Auto Photo"

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