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市场 > SEM > ZEISS / CARL ZEISS > NVision 40

NVision 40

类别
SEM
概述

The NVision 40 operates with two beams, one electron beam and one ion beam. Both beams can be used independently of each other to generate images using the secondary electrons emitted from the surface of the specimen. The ion beam can be used for imaging in addition material removal or coating purposes.

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