跳至主要内容
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
ASML TWINSCAN XT:400G
    说明
    i-Line Scanner
    配置
    无配置
    OEM 型号描述
    The TWINSCAN XT:400G 365-nm Step-and-Scan system is an ultra high-productivity, dual-stage lithography tool designed for volume 300-mm wafer production at 350-nm resolution. The dual wafer-stage technology of the TWINSCAN platform enables the exposure of one wafer and the alignment and mapping of the next wafer to take place in parallel, thereby virtually eliminating overhead time and allowing for continuous patterning of wafers.
    文件

    无文件

    ASML

    TWINSCAN XT:400G

    verified-listing-icon

    已验证

    类别
    Steppers & Scanners

    上次验证: 3 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    91663


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    ASML TWINSCAN XT:400G

    ASML

    TWINSCAN XT:400G

    Steppers & Scanners
    年份: 0状况: 二手
    上次验证3 天前

    ASML

    TWINSCAN XT:400G

    verified-listing-icon
    已验证
    类别
    Steppers & Scanners
    上次验证: 3 天前
    listing-photo-09818909b0b94f79a108631954699fc3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    91663


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    i-Line Scanner
    配置
    无配置
    OEM 型号描述
    The TWINSCAN XT:400G 365-nm Step-and-Scan system is an ultra high-productivity, dual-stage lithography tool designed for volume 300-mm wafer production at 350-nm resolution. The dual wafer-stage technology of the TWINSCAN platform enables the exposure of one wafer and the alignment and mapping of the next wafer to take place in parallel, thereby virtually eliminating overhead time and allowing for continuous patterning of wafers.
    文件

    无文件

    类似上架物品
    查看全部
    ASML TWINSCAN XT:400G

    ASML

    TWINSCAN XT:400G

    Steppers & Scanners年份: 0状况: 二手上次验证:3 天前