概述

The Osiris is a state-of-the-art analytical instrument designed for easy TEM imaging and fast chemical mapping in scanning transmission electron microscope (STEM) configuration using energy dispersive X-ray and electron energy loss spectroscopies (EDX and EELS). Its primary beam energy is 200keV, but a lower energy of 80 keV has been commissioned for carbonaceous nanostructures, e.g. nanotubes, and materials sensitive to knock-on damage.